Title :
Theoretical And Experimental Considerations Of A Silicon Junction Semiconductor Solid State Opening Switch
Author :
Zucker, Oved S. F. ; Giorgi, D.
Author_Institution :
Energy Compression Research Corp.
Keywords :
Capacitors; Charge carrier lifetime; Charge carrier processes; Drives; Power transmission lines; Radiative recombination; Silicon; Solid state circuits; Spontaneous emission; Switches;
Conference_Titel :
Plasma Science, 1991. IEEE Conference Record - Abstracts., 1991 IEEE International Conference on
Conference_Location :
Williamsburg, VA, USA
Print_ISBN :
0-7803-0147-1
DOI :
10.1109/PLASMA.1991.695775