VLSI implementation of moment invariants for automated inspection

Author

Armstrong, G.K. ; Simpson, M.L. ; Bouldin, D.W.

Author_Institution

Oak Ridge Nat. Lab., TN, USA

fYear

1990

fDate

11-13 Mar 1990

Firstpage

500

Lastpage

505

Abstract

The design of a VLSI ASIC (application-specific integrated circuit) for use in automated inspection is described. The inspection scheme uses M.K. Hu´s (1962) and S. Maitra´s (1979) algorithms for moment invariants. A prototype design that resolved the long delay time of the multiplier by custom designing adder cells based on the Manchester carry chain was generated. The prototype ASIC is currently being fabricated in 2.0-μm CMOS technology and has been simulated at 20 MHz. The final ASICs will be used in parallel at the board level to achieve the 230 MOPS necessary to perform moment-invariant algorithms in real time on 512×512 pixel images with 256 gray scales

Keywords

CMOS integrated circuits; VLSI; application specific integrated circuits; automatic optical inspection; computerised pattern recognition; computerised picture processing; 2 micron; 20 MHz; 262144 pixels; 512 pixels; CMOS technology; Manchester carry chain; VLSI ASIC; automated inspection; moment invariants; Algorithm design and analysis; Application specific integrated circuits; CMOS technology; Equations; Hardware; Inspection; Lighting; Pattern recognition; Pixel; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

System Theory, 1990., Twenty-Second Southeastern Symposium on

Conference_Location

Cookeville, TN

ISSN

0094-2898

Print_ISBN

0-8186-2038-2

Type

conf

DOI

10.1109/SSST.1990.138197

Filename

138197