Title :
Multielement profiling analysis of geochemical and environmental samples by inductively coupled plasma-atomic emission spectroscopy (ICP-AES) and inductively coupled plasma-mass spectrometry (ICP-MS)
Author :
Haraguchi, Hiroki ; Itoh, Akihide ; Takeuchi, Akihiro ; Fujimori, Eiji ; Hayashi, Toshio ; Hirose, Akio ; Sawatari, Hideyuki
Author_Institution :
Dept. of Appl. Chem., Nagoya Univ., Japan
Abstract :
Simultaneous multielement analysis of geochemical and environmental samples such as rock, sediment, seawater, and lake water have been carried out by inductively coupled plasma atomic emission spectroscopy (ICP-AES) and inductively coupled plasma mass spectrometry (ICP-MS). In these experiments, some instrumental improvement and sample pretreatment techniques were required to fulfil accurate multielement determination of 30-50 elements for each sample described above. Consequently, it becomes possible to characterize the samples by comparing the profiles of their multielement concentration distributions. Such multielement profiling analysis of various samples may be useful in the research fields such as geochemistry, environmental chemistry, material science and so forth
Keywords :
atomic emission spectroscopy; biomedical measurement; geochemistry; geophysical techniques; mass spectroscopic chemical analysis; mass spectroscopy; materials science; pollution measurement; environmental chemistry; environmental samples; geochemical samples; geochemistry; inductively coupled plasma-atomic emission spectroscopy; inductively coupled plasma-mass spectrometry; lake water; material science; multielement determination; multielement profiling analysis; rock; sample pretreatment; seawater; sediment; Argon; Atomic measurements; Chemical elements; Instruments; Lakes; Mass spectroscopy; Plasma chemistry; Plasma properties; Programmable logic arrays; Sediments;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351792