DocumentCode :
2336318
Title :
An automatic vernier scale method by CCD linear sensor
Author :
Wang, Hang ; Baba, Mitsuru ; Konishi, Tadataka
Author_Institution :
Fac. of Eng., Okayama Univ., Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
1353
Abstract :
In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement
Keywords :
CCD image sensors; digital simulation; displacement measurement; CCD linear image sensors; CCD pitch; automatic dimension measurement; automatic vernier scale method; displacement measurement; industrial measurement; vernier caliper; vernier scale; Charge coupled devices; Computer interfaces; Displacement measurement; Image sensors; Length measurement; Q measurement; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351804
Filename :
351804
Link To Document :
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