Title :
High-speed measuring system for testing mixed-signal-LSI performance and its application to digital-noise measurement
Author :
Tsukada, Toshiro ; Makie-Fukuda, Keiko ; Kikuchi, Takafumi ; Hotta, Masao ; Ando, Ihniaki
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
An automatic measuring system is developed for laboratory use for performance testing and design verification of analog and mixed-signal LSIs. Through the high-speed circuit and board design techniques, an 8-bit 1 GHz arbitrary waveform generator (AWG) and 3 GHz sampling waveform digitizer (SWD) were implemented in the system. This enables the range for measuring high-frequency mixed-signal-LSI performance to be extended from MHz up to GHz. A statistical digital-noise measurement method is presented as an application of the system. The digital-noise performance is automatically analyzed on the system by measuring and processing the statistical output results of the on-chip analog comparators operating on a mixed-signal LSI in order to detect the digital-noise coupling
Keywords :
analogue integrated circuits; automatic test equipment; automatic testing; electric noise measurement; integrated circuit testing; large scale integration; microwave measurement; mixed analogue-digital integrated circuits; quantisation (signal); statistical analysis; waveform generators; 1 GHz; 3 GHz; 8-bit arbitrary waveform generator; analog signal LSI; automatic measuring system; board design techniques; design verification; digital-noise coupling; digital-noise measurement; high-frequency mixed-signal-LSI performance; high-speed circuit; high-speed measuring system; laboratory use; mixed-signal LSI; mixed-signal-LSI performance; on-chip analog comparators; performance testing; sampling waveform digitizer; statistical digital-noise measurement; Automatic testing; Circuit noise; Circuit testing; Coupling circuits; Laboratories; Large scale integration; Logic testing; Noise measurement; Semiconductor device measurement; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351819
