Title :
A design prototyping using AD mixed tester
Author :
Yukawa, Akira ; Okamoto, Toshiyuki ; Maruyama, Yuuichi
Author_Institution :
Sys. Micro Div., NEC Corp., Kawasaki, Japan
Abstract :
It is very difficult to expect performances of analog/digital mixed (AD-mixed) LSIs, taking into account of component fluctuations, before getting actual samples. In this paper, some method to investigate characteristics of such interface LSIs, especially oversampled converters, using analog resources or test chip of a specific component is discussed
Keywords :
design for testability; digital-analogue conversion; large scale integration; mixed analogue-digital integrated circuits; sigma-delta modulation; test equipment; AD mixed tester; FFT; analog resources; analog/digital mixed LSI; component fluctuations; design prototyping; interface LSI; multi bit delta-sigma modulator; oversampled converters; test chip; Delta modulation; Filters; Fluctuations; Large scale integration; Linearity; Prototypes; Signal generators; Signal resolution; Signal to noise ratio; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351820
