Title :
High precision testing method of mixed signal device
Author :
Watanabe, A. ; Maekawa, M. ; Hamada, M. ; Hirase, J.
Author_Institution :
Testing Technol. Section, Matsushita Electron., Nagaokakyo, Japan
Abstract :
Recent advances in semiconductor production technology have enabled the on-chip configuration of integrated circuit systems. This has resulted in the increase of mixed signal LSIs that contain digital LSIs and analog LSIs, that have up till now been produced individually, being integrated on a single chip. When compared with individual digital and analog tests up till now, mixed signal LSIs pose the following problems for high-precision testing. High-precision measurement is difficult due to peripheral noise as analog signals are handled, and the reproducibility of measurement results is poor. This paper describes a method of testing sigma-delta D/A converters and LCD driver LSIs using an example where the above problems in a mixed signal LSI were solved. When conducting high-precision measurement of sigma-delta D/A converters with a mixed signal tester, measurement at the same precision as when a high-precision tester is used is possible when the influence of clock jitter, the influence of the power supply, the influence of peripheral circuits, and the dynamic range of the measurement system are taken into consideration. With respect to LCD driver LSIs, this paper describes testing problems and two inspection methods, the differential comparator system and the digitizer system
Keywords :
comparators (circuits); digital-analogue conversion; driver circuits; inspection; integrated circuit testing; jitter; large scale integration; mixed analogue-digital integrated circuits; power supplies to apparatus; sigma-delta modulation; LCD driver LSI; clock jitter; differential comparator; digitizer system; high precision testing; inspection methods; integrated circuit systems; mixed signal LSI; mixed signal device; on-chip configuration; peripheral noise; power supply; reproducibility; semiconductor production technology; sigma-delta D/A converters; Circuit testing; Delta-sigma modulation; Integrated circuit technology; Noise measurement; Power measurement; Production systems; Semiconductor device measurement; Semiconductor device noise; System testing; System-on-a-chip;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351821
