Title :
Mixed signal devices testing in Sony
Author :
Sakamoto, Nobuhiro
Author_Institution :
Audio/Video LSI Div., Sony Corp., Tokyo, Japan
Abstract :
Digitalization of consumer sets goes on increasingly. We have developed a lot of LSIs, which Sony consumer sets needed. Mixed signal devices are included in these LSIs. In this paper, mixed signal devices testing in Sony is described
Keywords :
CMOS integrated circuits; analogue-digital conversion; automatic testing; digital-analogue conversion; integrated circuit testing; large scale integration; mixed analogue-digital integrated circuits; semiconductor device testing; CMOS AD/DAC; Sony; compact disc players; digitalization; mixed signal devices; testing; CMOS process; Circuit testing; Digital signal processing; Digital signal processors; Large scale integration; Marketing and sales; Microcomputers; Pulse width modulation; Random access memory; Servomechanisms;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351822
