DocumentCode
2336620
Title
Mixed signal devices testing in Sony
Author
Sakamoto, Nobuhiro
Author_Institution
Audio/Video LSI Div., Sony Corp., Tokyo, Japan
fYear
1994
fDate
10-12 May 1994
Firstpage
1277
Abstract
Digitalization of consumer sets goes on increasingly. We have developed a lot of LSIs, which Sony consumer sets needed. Mixed signal devices are included in these LSIs. In this paper, mixed signal devices testing in Sony is described
Keywords
CMOS integrated circuits; analogue-digital conversion; automatic testing; digital-analogue conversion; integrated circuit testing; large scale integration; mixed analogue-digital integrated circuits; semiconductor device testing; CMOS AD/DAC; Sony; compact disc players; digitalization; mixed signal devices; testing; CMOS process; Circuit testing; Digital signal processing; Digital signal processors; Large scale integration; Marketing and sales; Microcomputers; Pulse width modulation; Random access memory; Servomechanisms;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.351822
Filename
351822
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