DocumentCode
2336968
Title
Optical Wireless OFDM System on FPGA: Study of LED Nonlinearity Effects
Author
Stefan, Irina ; Elgala, Hany ; Mesleh, Raed ; Brien, Dominic O. ; Haas, Harald
Author_Institution
Jacobs Univ. Bremen, Bremen, Germany
fYear
2011
fDate
15-18 May 2011
Firstpage
1
Lastpage
5
Abstract
Nonlinearities can drastically degrade the performance of OFDM (orthogonal frequency division multiplexing) based optical wireless (OW) communication systems using intensity modulation (IM) of the optical carrier. The light emitting diode (LED) transfer function distorts the signal amplitude and forces the lower signal peaks to be clipped at the LED turn-on voltage (TOV). Additionally, the upper signal peaks can result in optical output degradation. The induced distortion can be controlled by optimizing the bias point (BP) of the LED and/or backing-off the signal power modulating the LED. In this paper, the obtained experimental results using a hardware demonstrator for OW OFDM transmission based on field programmable gate array (FPGA) and off-the-shelf analog components are presented. The conducted measurements for the bit-error performance focus on determining the optimum BP and optimizing the OFDM signal amplitude to obtain best performance. In this context, the experimental bit-error ratio (BER) is obtained as a function of the LED BP and the RMS (root mean square) OFDM signal across the LED.
Keywords
OFDM modulation; error statistics; field programmable gate arrays; intensity modulation; light emitting diodes; optical communication; transfer functions; LED nonlinearity effects; bias point; bit error ratio; field programmable gate arrays; induced distortion; intensity modulation; light emitting diode; optical carrier; optical wireless OFDM system; root mean square OFDM signal; transfer function; Bit error rate; Light emitting diodes; Noise; OFDM; Optical distortion; Optical transmitters; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location
Yokohama
ISSN
1550-2252
Print_ISBN
978-1-4244-8332-7
Type
conf
DOI
10.1109/VETECS.2011.5956691
Filename
5956691
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