DocumentCode
2337476
Title
Improving resolution of analytical instruments in environmental laboratories
Author
Barwicz, Andrzej ; Slima, Mohamed Ben ; Massicotte, Daniel ; Morawski, Roman Z. ; Thellen, Claude
Author_Institution
Dept. d´´Ingenierie, Quebec Univ., Trois-Rivieres, Que., Canada
fYear
1994
fDate
10-12 May 1994
Firstpage
544
Abstract
Spectrometric and chromatographic measurements are most frequently used in the environmental laboratories performing the continual analysis of the chemical content of the atmosphere, waters, soils and industrial wastes. One of the attractive possibilities for diminishing the costs of high-resolution chemical analysis is the use of low-cost “imperfect” analytical instruments coupled with low-cost numerical processors capable of correcting their metrological “imperfections”. In this paper, the usefulness of some algorithms of measurand reconstruction for improving resolution of spectrometric and chromatographic measurements is demonstrated. The effectiveness of the proposed approach is illustrated with the real-world spectrometric and chromatographic data acquired in environmental laboratories
Keywords
Kalman filters; chemical analysis; chromatography; data acquisition; filtering and prediction theory; laboratories; laboratory apparatus and techniques; physics computing; pollution; pollution detection and control; spectrochemical analysis; Kalman filters; analytical instruments; atmosphere; chemical content; chromatographic measurements; continual analysis; environmental laboratories; high-resolution chemical analysis; industrial wastes; low-cost numerical processors; measurand reconstruction; resolution; soils; spectrometric measurements; waters; Atmosphere; Atmospheric measurements; Chemical analysis; Chemical industry; Costs; Instruments; Performance analysis; Performance evaluation; Soil measurements; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.351878
Filename
351878
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