Title :
Design of Totally Self-Checking Check Circuits for M-out of-N Codes
Author :
Anderson, Douglas A. ; Metze, Gernot
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer errors; Digital circuits; Electrical fault detection; Fault detection; Feeds; Logic circuits;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532641
