• DocumentCode
    2337685
  • Title

    Design of Totally Self-Checking Check Circuits for M-out of-N Codes

  • Author

    Anderson, Douglas A. ; Metze, Gernot

  • fYear
    1995
  • fDate
    27-30 Jun 1995
  • Firstpage
    244
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer errors; Digital circuits; Electrical fault detection; Fault detection; Feeds; Logic circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
  • Print_ISBN
    0-8186-7150-5
  • Type

    conf

  • DOI
    10.1109/FTCSH.1995.532641
  • Filename
    532641
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2337685