Title :
A spectrum analyzer using a high speed hopping PLL synthesizer
Author :
Kumagai, M. ; Agawa, H. ; Nakagomi, M. ; Siratori, Y. ; Tanimura, D. ; Kumada, A. ; Naganuma, H.
Author_Institution :
Yokogawa Electr. Corp., Tokyo, Japan
Abstract :
A new spectrum analyzer for an RF LSI Tester is developed. Using a high speed hopping synthesizer in the downconversion unit, this analyzer sweeps digitally at high speed. New applications for RF testing are proposed using this fast digital sweep technology
Keywords :
frequency synthesizers; integrated circuit testing; large scale integration; mobile radio systems; phase-locked loops; radiotelephony; spectral analysers; spectral analysis; test equipment; RF LSI Tester; RF testing; digital sweep technology; downconversion unit; high speed hopping PLL synthesizer; spectrum analyzer; two step pretuned IC; Large scale integration; Phase locked loops; RF signals; Radio frequency; Spectral analysis; Synthesizers; System testing; Tuning; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351903
