DocumentCode :
2337904
Title :
WLC28-5: Impact of Frequency Offset and Timing Offset on the Performance of SC-FDE UWB
Author :
Wang, Yue ; Dong, Xiaodai
Author_Institution :
ECE Dept., Univ. of Victoria, Victoria, BC
fYear :
2006
fDate :
Nov. 27 2006-Dec. 1 2006
Firstpage :
1
Lastpage :
5
Abstract :
We investigate in this paper the effect of carrier frequency offset (CFO) and sampling timing offset (STO) on the performance of single carrier block transmission with frequency domain equalization (SC-FDE) over ultra-wideband (UWB) channels. Signal-to-interference-plus-noise ratio (SINR) of SC-FDE UWB in the presence of CFO is analyzed and compared with that of OFDM, where OFDM is shown to be more sensitive to CFO. We also study the effect of STO on the performance of SC-FDE. Two forms of STO are considered, i.e., a shifted sampling timing instant other than the optimal timing point and a distorted sampling rate other than the symbol rate. Our results show that the performance of SC-FDE is rather channel dependent when sampling at a non-optimal time instant within one symbol duration, where the energy of the sampled equivalent channel at the sampling point determines its BER performance. Moreover, an SC-FDE system is fairly sensitive to a distorted sampling rate at the receiver, where severe performance degradation can occur when the received signal is sampled at a sampling rate rather than symbol rate.
Keywords :
OFDM modulation; equalisers; error statistics; frequency-domain analysis; signal sampling; ultra wideband communication; BER; OFDM; SC-FDE UWB; carrier frequency offset; frequency domain equalization; sampling timing offset; signal-to-interference-plus-noise ratio; single carrier block transmission; ultra-wideband channels; Bit error rate; Degradation; Frequency domain analysis; OFDM; Rate distortion theory; Sampling methods; Signal analysis; Signal to noise ratio; Timing; Ultra wideband technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference, 2006. GLOBECOM '06. IEEE
Conference_Location :
San Francisco, CA
ISSN :
1930-529X
Print_ISBN :
1-4244-0356-1
Electronic_ISBN :
1930-529X
Type :
conf
DOI :
10.1109/GLOCOM.2006.779
Filename :
4151409
Link To Document :
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