DocumentCode
2337979
Title
Computer-based assistance of surgeons in the judgment of plastic nose surgeries (rhinoplasty)
Author
Achermann, B. ; Peleg, R. ; Xiaoyi Jiang ; Bunke, H. ; Feinendegen, D. ; Bruhlmann, Y. ; Tschopp, H.
Author_Institution
Inst. of Comput. Sci. & Appl. Math., Bern Univ., Switzerland
fYear
1997
fDate
20-20 June 1997
Firstpage
21
Abstract
Summary form only given, substantially as follows. The paper presents a tool which can assist surgeons in judging the success of nose surgeries. Furthermore, the tool is useful for investigating the long term development of noses which underwent plastic surgery (rhinoplasty). The described tool makes use of simple methods for the quantitative characterization of profile images of human noses. The main processing steps include image acquisition, binarization, profile extraction, profile normalization, feature extraction, and feature analysis. We introduce features that are suitable to characterize nose profiles extracted from lateral photographs of patients. Moreover, the tool can assist surgeons in a quantitative manner in judging the success of nose surgeries. It reliably detects regions where material has been added or removed, and quantitatively describes the changes. Traditionally, these changes are detected through visual inspection and are only qualitatively characterized. Thus the proposed method is useful in judging the results of surgery in a more objective and reproducible manner.
Keywords
feature extraction; medical image processing; surgery; binarization; computer-based assistance; feature analysis; feature extraction; human noses; image acquisition; lateral photographs; long term development; plastic nose surgeries; profile extraction; profile images; profile normalization; rhinoplasty; surgeons; Computer science; Feature extraction; Hospitals; Image analysis; Image reconstruction; Mathematics; Nose; Plastics; Surgery; Surges;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Intelligent Mechatronics '97. Final Program and Abstracts., IEEE/ASME International Conference on
Conference_Location
Tokyo, Japan
Print_ISBN
0-7803-4080-9
Type
conf
DOI
10.1109/AIM.1997.652879
Filename
652879
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