DocumentCode :
233804
Title :
Better-than-Worst-Case Timing Design with Latch Buffers on Short Paths
Author :
Uppu, Ravi Kanth ; Uppu, Ravi Tej ; Singh, Adit D. ; Polian, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
fYear :
2014
fDate :
5-9 Jan. 2014
Firstpage :
133
Lastpage :
138
Abstract :
Better-than-worst-case timing designs such as Razor introduce shadow flip-flops triggered by a delayed clock in parallel to the functional flip-flops for timing error detection through duplication and comparision. This arrangement suffers from the "short path" problem, whereby the activation of paths shorter than this timing skew can cause false errors to be flagged. The traditional solution is to add buffers to the short paths that are less than the clock skew between the duplicated error detection flip-flops. However, this approach adds considerable area and power overhead, particularly in the presence of significant process variations. This paper studies the use of latches to introduce extra delay on short paths. Holding short paths stable for the first phase of the clock allows the design to achieve a skew of half a clock period between the functional and shadow flip-flops without short path errors. We present a method that characterizes all the path groups and places latches in appropriate path segments of the circuit to ensure that all short paths driving duplicated flip-flops are delayed by half a clock cycle. Unit delay simulations for benchmark designs with and without process variations are presented. Average performance improvement (API) and best- case performance improvement (BPI) for designs are presented with an overall average performance improvement of about 15% and best case performance improvement of 32% at a cost of acceptable area overhead.
Keywords :
clocks; flip-flops; timing circuits; Razor; average performance improvement; best-case performance improvement; delayed clock; latch buffers; latches; shadow flip-flops; short paths; timing design; timing error detection; unit delay simulations; Adders; Clocks; Delays; Latches; Logic gates; Threshold voltage; Aggressive clock; Clock frequency scaling; Error detection; Path delay profiles; Process variations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Conference on
Conference_Location :
Mumbai
ISSN :
1063-9667
Type :
conf
DOI :
10.1109/VLSID.2014.30
Filename :
6733119
Link To Document :
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