Title :
A METHODOLOGY FOR FUNCTIONAL LEVEL TESTING OF MICROPROCESSORS
Author :
Thatte, Satish M. ; Abraham, Jacob A.
Keywords :
Circuit faults; Circuit testing; Data processing; Digital systems; Fault detection; Logic; Memory; Microprocessors; Registers; System testing;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532654
