DocumentCode
2338179
Title
The dielectric relaxation in capacitors and dielectric material and its effect on VCOs
Author
Kuenen, Jeroen C. ; Meijer, Gerard C M
Author_Institution
Electron. Res. Lab., Delft Univ. of Technol., Netherlands
fYear
1994
fDate
10-12 May 1994
Firstpage
443
Abstract
The linearity of accurate VCOs, sample-and-hold circuits and switched-capacitor circuits is limited by the short-term effects of dielectric relaxation in the applied capacitor. This paper presents a novel and accurate method to measure these short-term effects and discusses the measurement results for standard industrial capacitors, MOS and junction capacitors, parasitic capacitors of assembling materials and coaxial-cable capacitors. It is shown that the dielectric relaxation of a commonly used polycarbonate capacitor causes a non-linearity of 6%0 for a VCO in the frequency range from 1 kHz to 100 kHz. A very large dielectric-relaxation effect has been found for commonly used epoxy printed-circuit boards. This means that special care has to be taken when this material is applied in accurate VCOs
Keywords
capacitors; dielectric measurement; dielectric relaxation; electron device testing; electronic equipment testing; sample and hold circuits; switched capacitor networks; variable-frequency oscillators; MOS; VCO; assembling materials; capacitors; coaxial-cable capacitors; dielectric material; dielectric relaxation; dielectric-relaxation effect; epoxy printed-circuit boards; junction capacitors; linearity; nonlinearity; parasitic capacitors; polycarbonate capacitor; sample-and-hold circuits; short-term effects; standard industrial capacitors; switched-capacitor circuits; Assembly; Coaxial components; Dielectric materials; Dielectric measurements; Frequency; Linearity; MOS capacitors; Measurement standards; Switched capacitor circuits; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.351925
Filename
351925
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