Title :
TEST GENERATION FOR SYNCHRONOUS SEQUENTIAL CIRCUITS USING MULTIPLE OBSERVATION TIMES
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Keywords :
Circuit faults; Circuit testing; Clocks; Electrical fault detection; Fault detection; Hardware; Sequential analysis; Sequential circuits; Synchronization; Synchronous generators;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532659
