DocumentCode
2338187
Title
TEST GENERATION FOR SYNCHRONOUS SEQUENTIAL CIRCUITS USING MULTIPLE OBSERVATION TIMES
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
fYear
1995
fDate
27-30 Jun 1995
Firstpage
358
Keywords
Circuit faults; Circuit testing; Clocks; Electrical fault detection; Fault detection; Hardware; Sequential analysis; Sequential circuits; Synchronization; Synchronous generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN
0-8186-7150-5
Type
conf
DOI
10.1109/FTCSH.1995.532659
Filename
532659
Link To Document