Title :
Face recognition based on spectroface and uniform eigen-space SVD for one training image per person
Author :
He, Jia-Zhong ; Du, Ming-hui ; Pei, Sheng-Wei ; Wan, Quan
Author_Institution :
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
Abstract :
This paper proposes a method based on the first spectroface and singular value decomposition (SVD) to deal with face recognition with one training image per person. To acquire more information from the single training sample, the first order spectroface method is applied to obtain spectroface representation of facial image, then the spectroface representation is projected onto a uniform eigen-space that is obtained from SVD of standard spectroface image and the resultant coefficient vector is used as the feature of the facial image for recognition. The L1 distance classifier is adopted in recognition. Two standard databases from Yale University and Olivetti Research Laboratory are selected to evaluate the recognition accuracy of the proposed method. Experimental results show the effectiveness of the presented method.
Keywords :
eigenvalues and eigenfunctions; face recognition; learning (artificial intelligence); pattern classification; singular value decomposition; L1 distance classifier; eigen-space; face recognition; image training; singular value decomposition; spectroface representation; Educational institutions; Face recognition; Helium; Image recognition; Matrix decomposition; Pattern recognition; Physics; Singular value decomposition; Testing; Wide area networks; Face recognition; SVD; spectroface; uniform eigen-space;
Conference_Titel :
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
0-7803-9091-1
DOI :
10.1109/ICMLC.2005.1527795