Title :
Binary vs decade inductive voltage divider comparison and error decomposition
Author :
Avramov, S. ; Stenbakken, G.N. ; Koffman, A.D. ; Oldham, N.M. ; Gammon, R.W.
Author_Institution :
Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVDs with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to separate errors due to binary and decade structures with a 2σ uncertainty of 0.05 parts per million (ppm)
Keywords :
automatic testing; autotransformers; calibration; characteristics measurement; electronic equipment testing; voltage dividers; voltage measurement; binary structures; binary voltage divider; decade inductive voltage divider; decade structures; error decomposition; error vector; linear error model; structural models; Matrix decomposition; Noise measurement; Noise reduction; Parameter estimation; Predictive models; Redundancy; Switches; Testing; Transformers; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.351958
