DocumentCode :
2338793
Title :
Phase plane compensation of the NIST sampling comparator system
Author :
Deyst, J.P. ; Souders, T.M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
914
Abstract :
This paper describes a compensation method to improve the static and dynamic linearity of the response of an equivalent-time digitizer. The nonlinearity of the digitizer response is represented in a multidimensional lookup table as a function of digitizer state and appropriate parameters, such as the instantaneous signal value and slope. In operation, the lookup table is used to compensate for the nonlinearity of the digitizer response by subtracting the appropriate table value from each new sample taken of the input signal. A second lookup table can be added to compensate digitizer timebase nonlinearity. The digitizer being compensated is a sampling comparator system that produces noticeable distortion in signals such as high frequency sine waves. The performance of the compensated sampling comparator system is presented, for a range of input test signals having a variety of trajectories in the phase plane
Keywords :
analogue-digital conversion; compensation; computerised instrumentation; measurement standards; phase comparators; signal processing; signal processing equipment; table lookup; NIST sampling comparator; compensated sampling comparator; digitizer response; digitizer state; distortion; dynamic linearity; equivalent-time digitizer; high frequency sine waves; input test signals; multidimensional lookup table; nonlinearity; phase plane compensation; response; sampling comparator; static linearity; subtracting; Bandwidth; Circuits; Frequency; Laboratories; Linearity; Multidimensional systems; NIST; Probes; Sampling methods; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351959
Filename :
351959
Link To Document :
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