• DocumentCode
    2338793
  • Title

    Phase plane compensation of the NIST sampling comparator system

  • Author

    Deyst, J.P. ; Souders, T.M.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    914
  • Abstract
    This paper describes a compensation method to improve the static and dynamic linearity of the response of an equivalent-time digitizer. The nonlinearity of the digitizer response is represented in a multidimensional lookup table as a function of digitizer state and appropriate parameters, such as the instantaneous signal value and slope. In operation, the lookup table is used to compensate for the nonlinearity of the digitizer response by subtracting the appropriate table value from each new sample taken of the input signal. A second lookup table can be added to compensate digitizer timebase nonlinearity. The digitizer being compensated is a sampling comparator system that produces noticeable distortion in signals such as high frequency sine waves. The performance of the compensated sampling comparator system is presented, for a range of input test signals having a variety of trajectories in the phase plane
  • Keywords
    analogue-digital conversion; compensation; computerised instrumentation; measurement standards; phase comparators; signal processing; signal processing equipment; table lookup; NIST sampling comparator; compensated sampling comparator; digitizer response; digitizer state; distortion; dynamic linearity; equivalent-time digitizer; high frequency sine waves; input test signals; multidimensional lookup table; nonlinearity; phase plane compensation; response; sampling comparator; static linearity; subtracting; Bandwidth; Circuits; Frequency; Laboratories; Linearity; Multidimensional systems; NIST; Probes; Sampling methods; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.351959
  • Filename
    351959