Dynamic characterization of scan conversion-based transient digitizers

Author

Arpaia, P. ; Cennamo, F. ; Daponte, P. ; D´Apuzzo, M.

Author_Institution

Dipartimento di Ingegneria Elettrica, Napoli Univ., Italy

fYear

1994

fDate

10-12 May 1994

Firstpage

894

Abstract

This paper deals with a method for the dynamic characterization of scan conversion-based transient digitizers. Such a method is based on the application of a two-dimensional filtering process, implemented by using the Walsh transform, on the digitized data of the transient digitizer. The two-dimensional filtering process avoids the incorrect evaluation of the digitizer dynamic performance. Furthermore, a scan converter model to test the proposed method has been developed. To illustrate the validity and the application range of the method preliminary numerical results are reported

Keywords

Walsh functions; analogue-digital conversion; electron guns; filtering and prediction theory; numerical analysis; transforms; Walsh transform; dynamic characterization; electron beam model; numerical results; scan conversion-based transient digitizers; scan converter model; two-dimensional filtering; Circuit testing; Coupling circuits; Digital signal processing; Electron beams; Filtering; Image converters; Semiconductor diodes; Signal processing; Transient analysis; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Conference_Location

Hamamatsu

Print_ISBN

0-7803-1880-3

Type

conf

DOI

10.1109/IMTC.1994.351965

Filename

351965