DocumentCode :
23389
Title :
An Introduction to Mixed-Signal IC Test & Measurement [Book Review]
Author :
Davidson, Scott
Volume :
30
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
94
Lastpage :
96
Abstract :
This book is an excellent guide to the mixed signal test frontier. It provides the reader with the theory of analog test, which is common in this kind of book, but also much information on the practical aspects of analog test, and, even more importantly, tells the reader the common mistakes to avoid. This practical focus puts this book above the vast majority of other texts. All too often a book will describe five different ways of achieving a task, using a historical approach, but never tell the reader which one has been found to be the best, and is thus commonly used in industry."An Introduction to Mixed-Signal IC Test & Measurement," by Gordon Roberts, Frederich Taenzler and Mark Burns (ISBN: 978-0-19-979621-2) is an excellent guide to the mixed signal test frontier. It provides the reader with the theory of analog test, which is common in this kind of book, but also much information on the practical aspects of analog test, and, even more importantly, tells the reader the common mistakes to avoid. This practical focus puts this book above the vast majority of other texts. All too often a book will describe five different ways of achieving a task, using a historical approach, but never tell the reader which one has been found to be the best, and is thus commonly used in industry. All too many readers of books on digital testing might think that deductive fault simulation is being used somewhere. Such confusion is not a problem here. The reviewer says he has never seen a book which is as successful in combining the theoretical and practical, and in giving a hint about which method to use first in the midst of a large set of equations.
Keywords :
Book reviews; Discrete Fourier transforms; Integrated circuits; Radio frequency; Signal processing; Testing;
fLanguage :
English
Journal_Title :
Design & Test, IEEE
Publisher :
ieee
ISSN :
2168-2356
Type :
jour
DOI :
10.1109/MDAT.2013.2271566
Filename :
6607182
Link To Document :
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