Title :
Design and test of integrated circuits in nano era: What is next?
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
The talk addresses the technology scaling, its impact on design, test and reliability. Both the near term and long term trends will be covered. It will be shown that below 32 nm technology node, the design of reliable systems has to be done based on ldquounreliablerdquo components. Therefore, new design and test styles are required to maintain further technology scaling.
Keywords :
integrated circuit design; integrated circuit reliability; integrated circuit testing; nanoelectronics; integrated circuit design; integrated circuit testing; nanoera; reliability; Circuit testing; Circuits and systems; Integrated circuit reliability; Integrated circuit technology; Integrated circuit testing; Maintenance; Signal design; System testing;
Conference_Titel :
Signals, Circuits and Systems, 2008. SCS 2008. 2nd International Conference on
Conference_Location :
Monastir
Print_ISBN :
978-1-4244-2627-0
Electronic_ISBN :
978-1-4244-2628-7
DOI :
10.1109/ICSCS.2008.4746859
