DocumentCode
2339221
Title
Design and test of integrated circuits in nano era: What is next?
Author
Hamdioui, Said
Author_Institution
Delft Univ. of Technol., Delft
fYear
2008
fDate
7-9 Nov. 2008
Firstpage
1
Lastpage
1
Abstract
The talk addresses the technology scaling, its impact on design, test and reliability. Both the near term and long term trends will be covered. It will be shown that below 32 nm technology node, the design of reliable systems has to be done based on ldquounreliablerdquo components. Therefore, new design and test styles are required to maintain further technology scaling.
Keywords
integrated circuit design; integrated circuit reliability; integrated circuit testing; nanoelectronics; integrated circuit design; integrated circuit testing; nanoera; reliability; Circuit testing; Circuits and systems; Integrated circuit reliability; Integrated circuit technology; Integrated circuit testing; Maintenance; Signal design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Circuits and Systems, 2008. SCS 2008. 2nd International Conference on
Conference_Location
Monastir
Print_ISBN
978-1-4244-2627-0
Electronic_ISBN
978-1-4244-2628-7
Type
conf
DOI
10.1109/ICSCS.2008.4746859
Filename
4746859
Link To Document