• DocumentCode
    2339488
  • Title

    Design for testing SU-8 and PDMS based hybrid glucose sensor

  • Author

    Patel, Jasbir N. ; Kaminska, Bozena ; Gray, Bonnie L. ; Gates, Byron D.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC
  • fYear
    2008
  • fDate
    18-20 June 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this paper, a test method for testing SU-8 and PDMS based hybrid glucose sensor with gold electrodes sandwiched between the two SU-8 layers is presented. Poly dimethylesiloxane (PDMS) and SU-8 is used as a flexible and bio-compatible sensor substrate material. Furthermore, SU-8 and PDMS is optically transparent and haemocompatible which is very important for implantable sensors. Different methods for testing glucose sensors are mentioned in a separate section. These test methods are categorized in different sections namely, material related tests, fabrication related tests, electrochemical related test and glucose response tests. And each test section is sub-categorized in appropriate sub-sections. The bottom PDMS layer of the sensor is ~500 mum thick and both SU-8 layers are ~100 mum. Each sensor chip is 5.5 mm X 10.5 mm in size with 2 mm X 3 mm for the actual sensor area. Resistance of the successfully fabricated gold electrodes is measured between 1 to 5 mOmega. The drift of the sensors are measured using phosphate buffer followed by the linearity test using the glucose solution.
  • Keywords
    biosensors; electrochemical sensors; electrodes; polymers; PDMS-based hybrid glucose sensor; SU-8; bio-compatible sensor; electrochemical related test; fabrication related tests; glucose response tests; gold electrode resistance; haemocompatibility; material related tests; optically transparent material; phosphate buffer; poly(dimethylesiloxane); resistance 1 mohm to 5 mohm; sandwich structure; sensor chip; size 10.5 mm; size 2 mm; size 3 mm; size 5.5 mm; Biological materials; Biosensors; Electrical resistance measurement; Electrodes; Gold; Materials testing; Optical materials; Optical sensors; Semiconductor device measurement; Sugar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE 14th International
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4244-2395-8
  • Electronic_ISBN
    978-1-4244-2396-5
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2008.4581612
  • Filename
    4581612