Exploring dynamics of embedded ADC through adapted digital input stimuli

Author

Sheng, Xiaoqin ; Kerkhoff, Hans ; Zjajo, Amir ; Gronthoud, Guido

Author_Institution

Testable Design & Testing of Integrated Syst. Group, Univ. of Twente, Enschede

fYear

2008

fDate

18-20 June 2008

Firstpage

1

Lastpage

7

Abstract

This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.

Keywords

CMOS integrated circuits; analogue-digital conversion; digital signals; integrated circuit design; integrated circuit testing; CMOS technology; adapted digital input stimuli; analog-to-digital converters; digital waveform; dynamic parameter testing; pulse signal; transistor level; CMOS technology; Capacitors; Costs; Frequency; Linearity; Pulse width modulation; Semiconductor device testing; Signal generators; Signal processing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE 14th International

Conference_Location

Vancouver, BC

Print_ISBN

978-1-4244-2395-8

Electronic_ISBN

978-1-4244-2396-5

Type

conf

DOI

10.1109/IMS3TW.2008.4581617

Filename

4581617