• DocumentCode
    2339616
  • Title

    Sounds on least-squares four-parameter sine-fit errors due to harmonic distortion and noise

  • Author

    Deyst, J.P. ; Souders, T.M. ; Solomon, O.H.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    700
  • Abstract
    Least-squares sine-fit algorithms are used extensively in signal processing applications. The parameter estimates produced by such algorithms are subject to both random and systematic errors when the record of input samples consists of a fundamental sine wave corrupted by harmonic distortion or noise. The errors occur because, in general, such sine-fits will incorporate a portion of the harmonic distortion or noise into their estimate of the fundamental. Bounds are developed for these errors for least-squares four-parameter (amplitude, frequency, phase, and offset) sine-fit algorithms. The errors are functions of the number of periods in the record, the number of samples in the record, the harmonic order, and fundamental and harmonic amplitudes and phases. The bounds do not apply to cases in which harmonic components become aliased
  • Keywords
    analogue-digital conversion; error analysis; harmonic analysis; least squares approximations; parameter estimation; random noise; signal processing; A/D convertors; amplitude; digital oscilloscopes; frequency; harmonic amplitudes; harmonic distortion; harmonic order; harmonic phases; least-squares four-parameter sine-fit errors; noise; offset; parameter estimate; phase; random errors; signal processing; systematic errors; Acoustic noise; Additive noise; Amplitude estimation; Frequency estimation; Harmonic distortion; Laboratories; Least squares methods; Parameter estimation; Signal processing algorithms; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.352004
  • Filename
    352004