Title :
Smiling Measurement Based on ARM7 Microsystem Design
Author :
Li Wenshi ; Qian Min ; Jiang Lin
Author_Institution :
Sch. of Electron. & Inf. Eng., Soochow Univ., Suzhou, China
Abstract :
Smiling test aims at indirect detection of depression trend. This work focuses on construction of microsystem for smiling vs calm tests processing near infrared otopoint-signals. Db4 wavelet and multifractal analyses in tandem are introduced to improve the test validity. ARM7 microsystem features with touch LCD dialoging and embedded algorithms into interrupting service programs. Two nonlinear power laws were extracted in form of Pc = Pa s, ¿.1 mean = 1.0141 and ¿.2 mean = 1.0300, ¿ > 1 in validity of up 80%. It is easy to distinguish between healthy and depressive subjects in criterion of power laws ¿1 or ¿2 approaching 1.0000. And ¿2 effect is better than ¿1 for 5-subject in reason of more details mapping brain neurotransmitters and fractal synaptics.
Keywords :
brain; fractals; liquid crystal displays; microprocessor chips; neurophysiology; wavelet transforms; ARM7 microsystem design; Db4 wavelet analysis; embedded algorithms; fractal synaptics; mapping brain neurotransmitters and; multifractal analysis; near infrared otopoint-signals; nonlinear power laws; smiling measurement; smiling test; touch LCD dialoging; Algorithm design and analysis; Circuits; Electroencephalography; Electronic equipment testing; Fractals; Infrared detectors; Microprocessors; Neurotransmitters; Positron emission tomography; Wavelet analysis;
Conference_Titel :
Biomedical Engineering and Computer Science (ICBECS), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5315-3
DOI :
10.1109/ICBECS.2010.5462430
