• DocumentCode
    2340598
  • Title

    Some results on yield and local design rule relaxation

  • Author

    Crépeau, J. ; Thibeault, C. ; Savaria, Y.

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
  • fYear
    1993
  • fDate
    27-29 Oct 1993
  • Firstpage
    144
  • Lastpage
    151
  • Abstract
    The authors study the influence of the line separation in a bus structure on a circuit cost. This structure was selected because it is easy to analyze and yet widely used. Using an analytical model, It is shown that an optimal design rule exists and how the gains obtained by using this optimal design rule depend on the bus length, the defect size distribution exponent and the clustering parameter. Some of the conclusions apply more generally to the problem of realizing design rules in an integrated circuit
  • Keywords
    logic design; analytical model; bus length; bus structure; circuit cost; clustering parameter; defect size distribution exponent; line separation; local design rule relaxation; optimal design rule; Analytical models; Circuit simulation; Conductors; Cost function; Distributed computing; Integrated circuit modeling; Integrated circuit yield; Robustness; Routing; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
  • Conference_Location
    Venice
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-3502-9
  • Type

    conf

  • DOI
    10.1109/DFTVS.1993.595745
  • Filename
    595745