DocumentCode :
2340617
Title :
MOVPE growth and characterisation of (Al,Ga)N layers
Author :
Paszkiewiczt, R. ; Korbutowicz, R. ; Radziewicz, D. ; Panek, M. ; Paszkiewicz, R. ; Kozlowski, J. ; Boratynski, B. ; Tlaczala, M.
Author_Institution :
Inst. of Microsyst. Technol., Wroclaw Univ. of Technol., Poland
fYear :
1998
fDate :
5-7 Oct. 1998
Firstpage :
59
Lastpage :
62
Abstract :
The group III nitrides are promising materials for optoelectronic devices high temperature electronics and high power microwave devices. At the moment, MOVPE (Metalorganic Vapour Phase Epitaxy) seems to be the most successful and the most promising method and /spl alpha/ sapphire is believed to be the best substrate for GaN deposition. The paper presents the achievements in (Al,Ga)N deposition at the Institute of Microsystem Technology, Wroclaw University of Technology. The correlation between structural, optical and electrical properties of thick undoped high temperature GaN buffer layer and thin undoped AlGaN spacer layer grown on it are shown and discussed.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; wide band gap semiconductors; (Al,Ga)N layer; /spl alpha/-sapphire substrate; AlGaN; AlGaN spacer layer; GaN buffer layer; MOVPE growth; group III nitride; metalorganic vapour phase epitaxy; Epitaxial growth; Epitaxial layers; Gallium nitride; Microwave devices; Optical buffering; Optoelectronic devices; Paper technology; Space technology; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM '98. Second International Conference on
Conference_Location :
Smolenice Castle, Slovakia
Print_ISBN :
0-7803-4909-1
Type :
conf
DOI :
10.1109/ASDAM.1998.730166
Filename :
730166
Link To Document :
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