Title :
A new method to measure the distance between graduation lines on graduated scales
Author :
Penzes, W.B. ; Allen, R.A. ; Cresswell, M.W. ; Linholm, L.W. ; Teague, E.C.
Author_Institution :
Precision Eng. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small, graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not calibrated, except for critical applications, due to time and cost of optical calibration techniques. A method for calibrating line scales is presented which uses electrical test structure metrology. A description of the technique as well as examples of results from this technique are presented
Keywords :
calibration; distance measurement; light interferometry; measurement standards; micrometry; optical elements; optical instruments; potentiometers; electrical test structure metrology; graduated glass scale; graduated scales; graduation lines; line scales; microscopes; optical calibration; optical instruments; stage micrometer; Calibration; Frequency; Glass; Interferometric lithography; NIST; Optical interferometry; Optical refraction; Substrates; Testing; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.352064