Title :
Macroscopic method of diagnosing circuit networks using mark ratio as a parameter
Author :
Hayashi, Mishio ; Nakagomi, Koji
Author_Institution :
Advantest Sendai Labs. Ltd., Sendai, Japan
Abstract :
This paper describes the concept of specific measurement methods for, and measurement results from a new method of signal waveform recognition for use in analysis of circuit networks which exhibit repeated operation, consisting of a 4-parameter method based on a rectangular waveform
Keywords :
logic testing; pattern recognition; signal processing; waveform analysis; 4-parameter method; circuit networks; diagnoses; macroscopic method; mark ratio; rectangular waveform; repeated operation; signal waveform recognition; Circuit analysis; Clocks; IEEE members; Integrated circuit measurements; Laboratories; Logic circuits; Logic devices; Manufacturing; Signal analysis; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.352071
