DocumentCode :
2340880
Title :
A dynamic calibration system for transcient surface temperature transducers
Author :
Hanchang, Zhou ; Deheng, Pan ; Jinhui, Lan
Author_Institution :
North China Inst. of Technol., Shanxi, China
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
273
Abstract :
A dynamic calibration system is developed which includes a pulse laser and a continue wave laser as the excitation sources, an optically conjugate focusing system and an infrared detection system. The temperature rise rate can be controlled by the pulsewidth of the laser and the amplitude by the laser output. A large aperture focusing system is used to raise the signal-to-noise ratio on the infrared detector, which, including its conditioning circuit, has a time constant as low as 0.17 μs, such that the real temperature-time relation can be received. The static temperature-voltage relation of the infrared detector and its conditioning circuit is also calibrated on that system. The only change is that the continue wave laser is used as exciting source. A quick response thermocouple has been tested on the system. The rise time of 0.68 μs shows that the performance of both the thermocouple and the calibration system is excellent
Keywords :
calibration; infrared detectors; laser beam applications; optical phase conjugation; surface phenomena; temperature measurement; thermocouples; 0.17 mus; conditioning circuit; continue wave laser; dynamic calibration; excitation sources; infrared detection; infrared detector; large aperture focusing; optically conjugate focusing system; pulse laser; pulsewidth; quick response thermocouple; real temperature; signal-to-noise ratio; static temperature; static temperature voltage relation; temperature rise rate; thermocouple; time constant; transcient surface temperature transducers; voltage relation; Apertures; Calibration; Circuits; Infrared detectors; Laser excitation; Optical control; Optical pulses; Optical surface waves; Space vector pulse width modulation; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.352075
Filename :
352075
Link To Document :
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