Title :
Blue-Green Light Emission From Si and SiC Quantum Dots Co-Doped Si-Rich SiC
Junction Diode
Author :
Hung-Yu Tai ; Chih-Hsien Cheng ; Gong-Ru Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Si quantum dots and SiC quantum dots (SiC-QDs) codoped Si-rich silicon carbide (SixC1-x) based p-i-n junction lightemitting diodes (LEDs) with blue light emission is demonstrated. By growing the SixC1-x with plasma-enhanced chemical vapor deposition at relatively low temperature, the turn-on voltage of Si-rich SixC1-x LEDs can be reduced to 6.1 V when thinning i-SixC1-x layer to 25 nm because of higher tunneling probability and lower series resistance. The electroluminescent (EL) power increases to 136 nW, however, which inversely attenuates due to the reduced SiC-QDs if the i-SixC1-x thickness further shrinks to 25 nm. The principle EL peak at 500 nm with narrower shape and blue-green emission pattern is attributed to the self-trapped excitons at surface states among SiC-QDs. The external quantum efficiency (EQE) of the Si-rich SixC1-x LEDs with i-SixC1-x thickness of 50 nm is up to 1.58 × 10-1% with enhanced carrier tunneling probability. The carrier injection efficiency is enhanced to 46% by increasing the doping concentration to 1016 cm-3, leading to almost one order of magnitude improvement on the EQE of Si-rich SixC1-x LEDs.
Keywords :
electroluminescence; excitons; light emitting diodes; p-i-n diodes; plasma CVD; semiconductor doping; semiconductor quantum dots; silicon compounds; surface states; wide band gap semiconductors; LED; SiC; blue-green emission pattern; blue-green light emission; carrier injection efficiency; carrier tunneling probability; doping concentration; electroluminescent power; external quantum efficiency; p-i-n junction diode; p-i-n junction light emitting diodes; plasma enhanced chemical vapor deposition; power 136 nW; quantum dots; self-trapped excitons; series resistance; size 25 nm; size 50 nm; surface states; voltage 6.1 V; wavelength 500 nm; Doping; Junctions; Light emitting diodes; PIN photodiodes; Quantum dots; Silicon; Silicon carbide; $phbox{-}n$ and $phbox{-}ihbox{-}n$ junctions; Si-rich Si$_{x}$C $_{1-x}$; Silicon carbide quantum dots; carrier injection efficiency; electroluminescence; external quantum efficiency; light-emitting diodes; power conversion ratio; silicon quantum dots;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2013.2291701