• DocumentCode
    2341290
  • Title

    New approach to computation of offset curves for point-based geometries

  • Author

    Liling, Ge ; Yingjie, Zhang

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Xi´´an Univ. of Technol., Xi´´an
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    367
  • Lastpage
    371
  • Abstract
    This paper proposes a new method for the computation of offset curve in point-based geometries. Point-based tool path calculations are promising for surface milling, rapid prototyping, and engraving using three-axis milling machines. Different from existing methods, in proposed method, the offsets of curves are implemented using level set-based theory in image domain. Therefore problem resulted from topology changes of curves will be remedied automatically, and the level set-based segmentation approaches may be applied to detect the contours of objects on noisy image and compute their offset curves. In order to guide the offset operation at specific direction, the image with offset curve is transformed into binary level set representation at first. Then an offset filter is introduced to perform offset operation. As a result, an initial offset curve in the image can be obtained by filtering at a specific direction. The offset curve is further refined by using curve evolution approach. The resulting algorithm has been demonstrated by numerical experiment results.
  • Keywords
    computational geometry; curve fitting; filtering theory; image representation; image segmentation; machining; milling machines; object detection; rapid prototyping (industrial); binary level set representation; image domain; level set-based segmentation approach; level set-based theory; object detection; offset curve computation; offset filter; point-based geometry; point-based tool path calculation; rapid prototyping; surface milling; three-axis milling machine; Computational geometry; Filters; Image segmentation; Level set; Metalworking machines; Milling; Noise level; Object detection; Prototypes; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582541
  • Filename
    4582541