DocumentCode :
2341306
Title :
Why emissivity standards and what characteristics?
Author :
Gelpey, Jeff
Author_Institution :
Vortek Industries, Ltd.
fYear :
2003
fDate :
23-26 Sept. 2003
Firstpage :
151
Lastpage :
151
Keywords :
Collaboration; Materials reliability; Measurement standards; NIST; Optical materials; Semiconductor device reliability; Semiconductor materials; Standards development; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2003. RTP 2003. 11th IEEE International Conference on
Print_ISBN :
0-7803-7874-1
Type :
conf
DOI :
10.1109/RTP.2003.1249137
Filename :
1249137
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2341306
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