DocumentCode
2341306
Title
Why emissivity standards and what characteristics?
Author
Gelpey, Jeff
Author_Institution
Vortek Industries, Ltd.
fYear
2003
fDate
23-26 Sept. 2003
Firstpage
151
Lastpage
151
Keywords
Collaboration; Materials reliability; Measurement standards; NIST; Optical materials; Semiconductor device reliability; Semiconductor materials; Standards development; Temperature dependence; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Thermal Processing of Semiconductors, 2003. RTP 2003. 11th IEEE International Conference on
Print_ISBN
0-7803-7874-1
Type
conf
DOI
10.1109/RTP.2003.1249137
Filename
1249137
Link To Document