DocumentCode :
2341451
Title :
The analysis of packaging-induced failure in a cw laser diode
Author :
Yoo, J.S. ; Lim, Gubong ; Kim, T.
fYear :
1994
fDate :
28 Aug-2 Sep 1994
Firstpage :
108
Lastpage :
108
Keywords :
Diode lasers; Electron beams; Electron optics; Epitaxial layers; Failure analysis; Optical feedback; Optical pulse generation; Optical pumping; Packaging; Power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 1994 Conference on
Print_ISBN :
0-7803-1789-0
Type :
conf
DOI :
10.1109/CLEOE.1994.636200
Filename :
636200
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2341451
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