• DocumentCode
    2341578
  • Title

    Non-parametric calibration of a time domain reflectometer

  • Author

    Boets, Patrick ; Van Biesen, L.

  • Author_Institution
    Dept. of Fundamental Electr. & Instrum., Vrije Univ., Brussels, Belgium
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    114
  • Abstract
    The non-parametric calibration procedure consists in finding the scattering parameters of the line network that connects the reflectometer and the device under test. The scattering parameters are determined by using the S11 measurement of the connection cable terminated with three different loads (open, short and load). Since commercial reflectometers digitize only voltages, one has to extent the hardware so that it becomes possible to measure currents. A current to voltage transducer will be applied. This transducer will be parametric calibrated. For each load, the voltage and current reflectogram will be measured and transformed to the frequency domain where the S11 equivalent can be calculated. The corrected voltage reflectogram can be obtained through convolution of the excitation pulse with the time domain representation of S11. Due to the limited energy at high frequencies of the pulse-like excitation signals, one has to apply a deconvolution technique to visualize the time domain representation of the S11 measurement
  • Keywords
    S-parameters; calibration; electric connectors; electric current measurement; fault location; frequency-domain analysis; multiport networks; time-domain reflectometry; transducers; voltage measurement; S11 measurement; connection cable; convolution; corrected voltage reflectogram; current to voltage transducer; deconvolution technique; excitation pulse; line network; nonparametric calibration; scattering parameters; time domain reflectometer; time domain representation; Calibration; Current measurement; Frequency domain analysis; Frequency measurement; Hardware; Pulse measurements; Scattering parameters; Testing; Transducers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.352113
  • Filename
    352113