DocumentCode :
2342140
Title :
Design of reliable software via general combination of N-version programming and acceptance testing
Author :
Parhami, Behrooz
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
1996
fDate :
30 Oct-2 Nov 1996
Firstpage :
104
Lastpage :
109
Abstract :
N-version programming (NVP) and acceptance testing (AT) are techniques for ensuring reliable computation results from imperfect software. Various symmetric combinations of NVP and AT have also been suggested. We take the view that one can insert an AT at virtually any point in a suitably constructed multi-channel computation graph and that judicious placement of ATs will lead to cost-effective reliability improvement. Hence, as a general framework for the creation, representation, and analysis of combined NVP-AT schemes, we introduce MTV graphs, and their simplified data-driven version called DD-MTV graphs, composed of computation module (M), acceptance test (T), and voter (V) building blocks. Previous NVP-AT schemes, such as consensus recovery blocks, recoverable N-version blocks, and N-self-checking programs can be viewed as special cases of our general combining scheme. Results on the design and analysis of new NVP-AT schemes are presented and the reliability improvements are quantified. We show, e.g., that certain, somewhat asymmetric, combinations of M, T, and V building blocks can lead to higher reliabilities than previously proposed symmetric arrangements having comparable or higher complexities
Keywords :
software fault tolerance; software reliability; DD-MTV graphs; N-version programming; acceptance test; acceptance testing; computation module; cost-effective reliability improvement; imperfect software; multi-channel computation graph; reliability improvements; reliable software; voter building blocks; Application software; Control systems; Hardware; Information processing; Process control; Software design; Software systems; Software testing; Space exploration; Voting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering, 1996. Proceedings., Seventh International Symposium on
Conference_Location :
White Plains, NY
Print_ISBN :
0-8186-7707-4
Type :
conf
DOI :
10.1109/ISSRE.1996.558714
Filename :
558714
Link To Document :
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