• DocumentCode
    2342202
  • Title

    Power bipolar transistor performance in hard- and soft-switching power converters

  • Author

    Vijayalakshmi, R. ; Trivedi, M. ; Shenai, K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    888
  • Abstract
    This paper presents a detailed performance analysis of a power bipolar junction transistor (BJT) under hard-and soft-switching conditions. The main focus is on improving the switching loss and switching time of the device. It is shown that an improvement by an order of magnitude can be obtained in turn-off loss under soft-switching as compared to hard-switching. This improvement is achieved by exploiting the interaction between the circuit and the device in soft-switching. The effect of circuit components and conditions on switching time and loss of the device is also discussed. Distinct characteristics are observed during soft-switching of the device (ZVS and ZCS). The physical mechanisms responsible for these characteristics are analyzed in detail based on the internal charge dynamics with the aid of an advanced two-dimensional mixed circuit and device simulator. The results obtained from simulations are compared and validated with extensive measured data.
  • Keywords
    power bipolar transistors; power convertors; power semiconductor switches; semiconductor device models; semiconductor device testing; switching circuits; ZCS; ZVS; circuit components; hard-switching power converters; internal charge dynamics; power bipolar junction transistor; power bipolar transistor performance; soft-switching power converters; switching loss; switching time; two-dimensional mixed circuit/device simulator; Bipolar transistors; Charge carrier processes; Circuit simulation; Electronic ballasts; MOSFETs; Stress; Switching circuits; Switching loss; Zero current switching; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.730250
  • Filename
    730250