• DocumentCode
    2342216
  • Title

    Rapid isothermal batch processing

  • Author

    Dip, Anthony ; Soave, Robert ; Kaushal, Sanjeev ; Nakao, Ken ; Sasaki, Sadao ; Tsuda, Toshitake

  • Author_Institution
    Tokyo Electron America Inc., Austin, TX, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    39
  • Lastpage
    46
  • Abstract
    Hot-wall batch thermal processing technology offers advantages of true emissivity-independent heating, excellent process uniformity and repeatability, and low cost of ownership (CoO). However, the comparatively long raw process time and queuing time associated with large-batch furnaces is contrary to the requirements of short cycle time manufacturing. In addition, there is concern that the configuration of traditional batch reactors makes it difficult to run complex chemical reactions required for deposition of advanced electronic materials, such as high-k dielectrics. This paper discusses the concept of Rapid Isothermal Batch Processing and presents TELFORMULA, an innovative isothermal hot-wall reactor that is designed to meet the needs of sub-100 nm manufacturing. Also discussed in this work are the cycle-time limiting processing sequences and methods employed in reducing the overhead time to commercially acceptable levels. Advances in component technologies are also presented which include: new ultra-fast heating element, advanced temperature control algorithms, and hardware optimizations for rapid vacuum formation and venting. Data is presented demonstrating the commercial feasibility of the TELFORMULA, along with cycle time performance and film uniformity for conventional films, such as oxides and nitrides, as well as advanced chemistries such as metal and high-k thin films.
  • Keywords
    batch processing (industrial); rapid thermal processing; semiconductor device manufacture; TELFORMULA; advanced temperature control algorithms; commercial feasibility; cost of ownership; cycle-time limiting processing; film uniformity; hot-wall technology; isothermal hot-wall reactor; process uniformity; rapid isothermal batch processing; rapid vacuum formation; repeatability; ultra-fast heating; venting; Chemical reactors; Costs; Furnaces; Heating; High K dielectric materials; High-K gate dielectrics; Inductors; Isothermal processes; Manufacturing processes; Rapid thermal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Thermal Processing of Semiconductors, 2002. RTP 2002. 10th IEEE International Conference of
  • Print_ISBN
    0-7803-7465-7
  • Type

    conf

  • DOI
    10.1109/RTP.2002.1039438
  • Filename
    1039438