Title :
Application of scanning tunneling microscope to high-speed optical sampling measurement
Author :
Takeuchi, Koichiro ; Kasahara, Yukio
Author_Institution :
Teratec Corp., Tokyo, Japan
Abstract :
A novel method for a measurement of a high-speed electrical waveform using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photo-conductive switch on the STM probe to measure a high-speed signal in an equivalent sampling procedure. The temporal resolution of 160 ps has been achieved. This method has the potential to create a breakthrough in ultra high-speed waveform measurement through this unique combination of optical sampling and STM technology
Keywords :
circuit testing; electro-optical devices; electronic equipment testing; photoconducting switches; scanning tunnelling microscopy; signal sampling; waveform analysis; STM; STM probe; equivalent sampling; high-speed electrical waveform; high-speed optical sampling measurement; high-speed signal; optical pulse train; photoconductive switch; scanning tunneling microscope; temporal resolution; ultra high-speed waveform measurement; Electric variables measurement; High speed optical techniques; Optical microscopy; Optical pulses; Optical switches; Probes; Pulse measurements; Sampling methods; Signal resolution; Tunneling;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
DOI :
10.1109/IMTC.1994.352161
