• DocumentCode
    2342275
  • Title

    Magnetic force microscope (MFM) imaging with electrodeposited tips

  • Author

    Sueoka, Kazuhisa ; Inagami, Kouji ; Imamura, Tafumi ; Tatebe, Katsuhiko ; Mukasa, Koichi

  • Author_Institution
    Fac. of Eng., Hokkaido Univ., Sapporo, Japan
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    1419
  • Abstract
    Since magnetic force microscopy images are influenced by magnetic properties of a tip apex, it is important to characterize its properties and to examine tip-sample interaction. The electrodeposition is useful to make various controlled magnetic tips. We made the MFM tips of electrodeposited FeNi, Co and FeCo films on electrically polished tungsten tips. For measuring a strong field such as that from a recording head, Co tip gives a well contrasted and unsaturated image. For a weak field from a recorded medium, FeCo tip offers a sensitive image. The thickness of the coated tip also affects the images. We studied three different types of tip that are coated with FeCo (about 20 nm, 300 nm, and 2 μm in thickness) by observing a longitudinal recorded medium to compare their sensitivity and resolution. The finest image was obtained with a 300 nm coated tip. As a further study, we demonstrated the utility of magnetotactic bacteria to characterize the magnetic structure of a MFM tip apex
  • Keywords
    cobalt; electrodeposits; iron alloys; magnetic field measurement; magnetic force microscopy; magnetic heads; magnetic sensors; microscopy; 2 mum; 20 nm; 300 nm; Co; Co film; Co tip; FeCo; FeCo films; FeNi; FeNi film; SEM; coated tip; controlled magnetic tips; electrically polished tungsten tips; electrodeposited tips; longitudinal recorded medium; magnetic force microscope; magnetic structure; magnetotactic bacteria; recording head; resolution; sensitivity; tip apex; tip-sample interaction; Atomic measurements; Force measurement; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic properties; Microorganisms; Scanning electron microscopy; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.352162
  • Filename
    352162