DocumentCode
2342275
Title
Magnetic force microscope (MFM) imaging with electrodeposited tips
Author
Sueoka, Kazuhisa ; Inagami, Kouji ; Imamura, Tafumi ; Tatebe, Katsuhiko ; Mukasa, Koichi
Author_Institution
Fac. of Eng., Hokkaido Univ., Sapporo, Japan
fYear
1994
fDate
10-12 May 1994
Firstpage
1419
Abstract
Since magnetic force microscopy images are influenced by magnetic properties of a tip apex, it is important to characterize its properties and to examine tip-sample interaction. The electrodeposition is useful to make various controlled magnetic tips. We made the MFM tips of electrodeposited FeNi, Co and FeCo films on electrically polished tungsten tips. For measuring a strong field such as that from a recording head, Co tip gives a well contrasted and unsaturated image. For a weak field from a recorded medium, FeCo tip offers a sensitive image. The thickness of the coated tip also affects the images. We studied three different types of tip that are coated with FeCo (about 20 nm, 300 nm, and 2 μm in thickness) by observing a longitudinal recorded medium to compare their sensitivity and resolution. The finest image was obtained with a 300 nm coated tip. As a further study, we demonstrated the utility of magnetotactic bacteria to characterize the magnetic structure of a MFM tip apex
Keywords
cobalt; electrodeposits; iron alloys; magnetic field measurement; magnetic force microscopy; magnetic heads; magnetic sensors; microscopy; 2 mum; 20 nm; 300 nm; Co; Co film; Co tip; FeCo; FeCo films; FeNi; FeNi film; SEM; coated tip; controlled magnetic tips; electrically polished tungsten tips; electrodeposited tips; longitudinal recorded medium; magnetic force microscope; magnetic structure; magnetotactic bacteria; recording head; resolution; sensitivity; tip apex; tip-sample interaction; Atomic measurements; Force measurement; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic properties; Microorganisms; Scanning electron microscopy; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.352162
Filename
352162
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