Title :
New directions in electronics test philosophy, strategy, and tools
Author :
Claasen, Theo ; Beenker, Frans ; Jamieson, James ; Bennetts, Ben
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
The authors review test objectives and related test strategies throughout the life cycle of electronic products, from system design conception to field maintenance. They reinforce the philosophy of integrating test methodology into the design process and outline the organizational responsibilities within the design and development communities. Consideration is given to product objectives and related test requirements; test economics; test objectives and test activities; structural, functional, application-mode, and characterization testing; design for testability techniques; the test tool box; and test program generation
Keywords :
automatic testing; electronic equipment testing; production testing; design for testability; economics; electronic products testing; field maintenance; life cycle; product objectives; system design conception; test program generation; test tool box; Costs; Design methodology; Electronic equipment testing; Laboratories; Life testing; Manufacturing; Process design; Product design; Product development; System testing;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36211