DocumentCode :
2343022
Title :
Effects of A-D conversion nonidealities on distributed sampling in dense sensor networks
Author :
Ergen, Sinem Coleri ; Varaiya, Pravin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Berkeley, CA
fYear :
0
fDate :
0-0 0
Firstpage :
202
Lastpage :
209
Abstract :
We address the effect of the errors occurring at the analog-to-digital converter (ADC), from quantization noise, circuit noise, aperture uncertainty and comparator ambiguity, on the accuracy of sensor field reconstruction. We focus on the oversampling of bandlimited sensor fields in a distributed processing environment. It has previously been shown that pulse code modulation (PCM) style sampling fails to decrease the quantization error above some finite sampling rate. We show that the dither-based scheme, developed to decrease the quantization error, fails to decrease random errors associated with circuit noise, aperture uncertainty and comparator ambiguity. We propose an advanced dither-based sampling scheme with the goal of reducing both kinds of errors by increasing the density of the sensor nodes. It is based on distributing the task of improving the quantization error and random error among the nodes. The error of the scheme is shown to be O(1/rfrac12) for oversampling rate r. The maximum energy consumption per node is O(log(r)). Finally, the bit rate of the scheme is O(1/rfrac12log(r)) and it offers robustness to node failures in terms of a graceful degradation of reconstruction error
Keywords :
analogue-digital conversion; circuit noise; distributed processing; distributed sensors; quantisation (signal); signal reconstruction; signal sampling; ADC; analog-to-digital converter; aperture uncertainty; circuit noise; comparator ambiguity; dense sensor network; distributed processing environment; distributed sampling; dither-based scheme; energy consumption; oversampling; quantization noise; reconstruction error; Analog-digital conversion; Apertures; Circuit noise; Distributed processing; Modulation coding; Pulse modulation; Quantization; Sampling methods; Uncertainty; Working environment noise; ADC; accuracy; distributed sampling; energy; fault tolerance; sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Processing in Sensor Networks, 2006. IPSN 2006. The Fifth International Conference on
Conference_Location :
Nashville, TN
Print_ISBN :
1-59593-334-4
Type :
conf
DOI :
10.1109/IPSN.2006.244164
Filename :
1662459
Link To Document :
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