Title :
Hierarchical fault simulation in combinational circuits
Author :
Schulz, Michael H. ; Seiss, Bernhard H. ; Brglez, Franc
Author_Institution :
Dept. of Electr. Eng., Tech. Univ., Munich, West Germany
Abstract :
A method is presented for speeding up fault simulation in combinational circuits by taking advantage of a hierarchical circuit description. The parallel-pattern single-fault-propagation technique is combined with the concept of fanout-free regions, and this approach is then extended to exploit hierarchy. A number of illustrative experiments demonstrate the efficiency of the proposed method and substantiate the gains in simulation speed. Besides the savings in CPU time, the method results in a significant reduction in the memory requirements for creating and maintaining the computational model of the circuit to be simulated
Keywords :
VLSI; combinatorial circuits; digital simulation; fault location; integrated logic circuits; logic CAD; logic testing; CPU time; combinational circuits; computational model; fanout-free regions; fault simulation; hierarchical fault simulation; logic CAD; logic testing; memory requirements; parallel-pattern single-fault-propagation; simulation speed; Acceleration; Artificial intelligence; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Costs; Very large scale integration;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36217