• DocumentCode
    2343028
  • Title

    Hierarchical fault simulation in combinational circuits

  • Author

    Schulz, Michael H. ; Seiss, Bernhard H. ; Brglez, Franc

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ., Munich, West Germany
  • fYear
    1989
  • fDate
    12-14 Apr 1989
  • Firstpage
    33
  • Lastpage
    40
  • Abstract
    A method is presented for speeding up fault simulation in combinational circuits by taking advantage of a hierarchical circuit description. The parallel-pattern single-fault-propagation technique is combined with the concept of fanout-free regions, and this approach is then extended to exploit hierarchy. A number of illustrative experiments demonstrate the efficiency of the proposed method and substantiate the gains in simulation speed. Besides the savings in CPU time, the method results in a significant reduction in the memory requirements for creating and maintaining the computational model of the circuit to be simulated
  • Keywords
    VLSI; combinatorial circuits; digital simulation; fault location; integrated logic circuits; logic CAD; logic testing; CPU time; combinational circuits; computational model; fanout-free regions; fault simulation; hierarchical fault simulation; logic CAD; logic testing; memory requirements; parallel-pattern single-fault-propagation; simulation speed; Acceleration; Artificial intelligence; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Costs; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1989., Proceedings of the 1st
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-1937-6
  • Type

    conf

  • DOI
    10.1109/ETC.1989.36217
  • Filename
    36217