Title :
A P1500 compliant BIST-based approach to embedded RAM diagnosis
Author :
Appello, D. ; Corno, E. ; Giovinetto, M. ; Rebaudengo, M. ; Reorda, M. Sonza
Abstract :
This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows one to test multiple modules in the same chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements
Keywords :
VLSI; automatic test software; built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; measurement standards; random-access storage; BIST module; March algorithm; P1500 compliant BIST-based approach; P1500 standard compliance; STMicroelectronics; TAP controller interfacing; diagnostic procedure; embedded RAM diagnosis; embedded core test standard; external ATE software environment; faulty embedded RAMs; multiple modules testing; Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Manufacturing processes; Performance analysis; Production; Read-write memory;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990266
