DocumentCode
2343074
Title
Design of a digitalized burn-in test plant
Author
Hwu, K.I. ; Chen, Y.H.
Author_Institution
Center for Power Electron. Technol., Nat. Taipei Univ. of Technol., Taipei
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
415
Lastpage
419
Abstract
A burn-in test plant with multiple inputs having a wide range of input voltages is proposed herein, whose controller is realized by a digital signal processor (DSP). By means of DSP, data monitoring and command setting are easy to realize. First of all, the details of the proposed circuit topology and the corresponding control strategy are presented, and secondly some experimental results are provided to verify the proposed burn-in test plant.
Keywords
digital signal processing chips; integrated circuit testing; network topology; circuit topology; command setting; data monitoring; digital signal processor; digitalized burn-in test plant; Circuit testing; DC-DC power converters; Digital signal processors; Electronic equipment testing; Power electronics; Power supplies; Signal design; Switches; Topology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Sustainable Energy Technologies, 2008. ICSET 2008. IEEE International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1887-9
Electronic_ISBN
978-1-4244-1888-6
Type
conf
DOI
10.1109/ICSET.2008.4747043
Filename
4747043
Link To Document