DocumentCode
2343221
Title
Memory read faults: taxonomy and automatic test generation
Author
Benso, Alfredo ; Di Carlo, Stefano ; Di Natale, Giorgio ; Prinetto, P.
Author_Institution
Dipt. di Automatica a Informatica, Politecnico di Torino, Italy
fYear
2001
fDate
2001
Firstpage
157
Lastpage
163
Abstract
This paper presents an innovative algorithm for the automatic generation of March tests. The proposed approach is able to generate an optimal March test for an unconstrained set of memory faults in very low computation time. Moreover, we propose a new complete taxonomy for memory read faults, a class of faults never carefully addressed in the past
Keywords
automatic test pattern generation; integrated circuit testing; integrated memory circuits; logic testing; ATPG; March tests generation; automatic test generation; low computation time; memory read faults; optimal March test; read faults taxonomy; unconstrained memory fault set; Automatic testing; Availability; Circuit faults; Circuit testing; Fault detection; Power supplies; Production; Random access memory; Taxonomy; World Wide Web;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990275
Filename
990275
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