DocumentCode
2343396
Title
Test generation for current testing
Author
Nigh, Phil ; Maly, Wojciech
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA
fYear
1989
fDate
12-14 Apr 1989
Firstpage
194
Lastpage
200
Abstract
Current testing has been found to be useful for testing CMOS ICs because it can detect a large class of manufacturing defects. The concept of current testing is described; the classes of defects detectable by current testing and the conditions to detect a given defect are described; and a general test-vector generation algorithm for current testing is developed and applied to two examples
Keywords
CMOS integrated circuits; VLSI; automatic testing; fault location; integrated circuit testing; logic testing; CMOS ICs; IC testing; VLSI; automatic testing; current testing; logic testing; test-vector generation algorithm; CMOS technology; Circuit faults; Circuit noise; Circuit testing; Computer aided manufacturing; Current measurement; Monitoring; Semiconductor device modeling; Steady-state; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1989., Proceedings of the 1st
Conference_Location
Paris
Print_ISBN
0-8186-1937-6
Type
conf
DOI
10.1109/ETC.1989.36243
Filename
36243
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